Browsing by Subject "Radiation Particle Strikes, Single Event Upsets (SEUs), Soft Errors, Single Event Transients, Design, Analysis, Modeling, DVS, Process Variations"

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    • Analysis and Design of Resilient VLSI Circuits 
      Garg, Rajesh (2010-07-14)
      The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and ...